Please use this identifier to cite or link to this item: http://localhost:8080/xmlui/handle/123456789/3550
Full metadata record
DC FieldValueLanguage
dc.contributor.authorRamizy, Asmiet-
dc.date.accessioned2022-10-19T21:23:20Z-
dc.date.available2022-10-19T21:23:20Z-
dc.date.issued2021-11-15-
dc.identifier.urihttp://localhost:8080/xmlui/handle/123456789/3550-
dc.description.abstract"Abstract: In this paper, ammonia gas sensor based on Ag/GaN/ Si and Ag/GaN/PS with (3 and 7 layers) was fabricated; the effect number of layers on the morphology, structural, and sensitivity of the device has been studied. XRD pattern for GaN/Si showed that the film has a polycrystalline structure in nature with presents many of diffraction peaks of hexagonal structure, with the exception plane (111) at 39.09 which has a cubic structure, no other structures such as Ga2O3 is found, and these indicates that GaN output from the precursor was highly successful. FESEM images showed a change in surface morphology as the number of layers increases. from AFM technique, it's found that reduced in particle size can significantly affect sensitivity improvement, therefore the maximum sensitivity to NH3 gas was observed in GaN/PS (3 layers) which possess the few grain size, and found to be 931 %, at 100ºC. "en_US
dc.publisherAIPen_US
dc.subject" Effect, GaN, Spin coating, Porous Silicon, Hexagonal phase "en_US
dc.title"The effect of GaN nanostructure layers on the toxic gas sensor sensitivity "en_US
Appears in Collections:قسم الفيزياء

Files in This Item:
File Description SizeFormat 
8 - Asmiet Abdalghafoor (2) 2021.pdf1.27 MBAdobe PDFView/Open


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.