Please use this identifier to cite or link to this item: http://localhost:8080/xmlui/handle/123456789/3555
Title: The Effect of Acidic Solution (H2SO4) on the Nano Composites Materials (EP/ Nano-SiO2): Image Analysis Study
Authors: Hameed, Abdul -Adheem
Al-Ani, Muzhir
Keywords: Composite Material
Image Enhancement
Nano Silicon Dioxide (Nano-SiO2);
Image Analysis
Issue Date: 25-Aug-2019
Publisher: REVISTA AUS
Abstract: Nanotechnology is a new technology that are used in wide range of applications and a nanomaterial having tiny particles of nanoscale sizes that produced and processed by nanotechnology. Mixing of physical and information technology issues will produce a powerful approach for processing and analyzing. Image processing is an efficient tool for processing and analyzing the material surface. This work is implemented via many stages: preparing the materials, molding the samples, image acquisition of the molding surface, enhance the image surface and measuring many parameters to ensure the surface enhancement. The obtained results are obtained from surface images before and after immersion with and without filter. Average filter, Gaussian filter, median filter and standard deviation filters are applied in this approach. Standard deviation filter leading to high performance method comparing other types of filters in which have maximum value of Peak Signal to Noise Ratio (PSNR) and minimum value of Mean Square Error MSE. Image analysis tools leads to good results of texture surface analysis and that is identified in image enhancement procedures. It is clear that the porosity of image surface of the samples at thickness (8mm) by weight fraction (0.05) is increased after immersion in acidic solution (H2SO4). The obtained results indicated that there is an efficient modification of surface image via applying different types of filters. In addition, standard deviation filter achieved high performance with high value of PSNR (54) and low value of MSE (0.25).
URI: http://localhost:8080/xmlui/handle/123456789/3555
Appears in Collections:قسم علوم الحاسبات

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