Please use this identifier to cite or link to this item: http://localhost:8080/xmlui/handle/123456789/3662
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dc.contributor.authorMashhadany, Yousif Al-
dc.contributor.authorJassam, Semeh-
dc.contributor.authorSami, Amead-
dc.contributor.authorNassar, Hebaa-
dc.date.accessioned2022-10-20T05:32:22Z-
dc.date.available2022-10-20T05:32:22Z-
dc.date.issued2012-
dc.identifier.issn2153-1293-
dc.identifier.urihttp://localhost:8080/xmlui/handle/123456789/3662-
dc.description.abstractThe recent rapid development of electronics and continual increase of the complexity and variety of electronic circuits chips, packets, micro- and embedded systems) creates a demand for viable test and diagnostic methods. These recent developments have led to a great deal of research interest in electronic diagnostic systems, especially of effective diagnosis methods of detection, localization and identification levels of hard (catastrophic) and soft (parametric) faults in analog circuits. At present, the majority of electronic devices (embedded systems) are designed based on digital circuits; however a lot of them also contain analog components that require more complicated testing techniques. This paper presents a novel, electronic components tester board with inside, outside of circuit under tested. The design is first simulated by using the electronic work-bench software Multisim 11 in order to obtain satisfactory theoretical results for each standalone element of the design. Thereafter, the design is practically implemented and experimentally verified to show agreement with the simulated results.en_US
dc.language.isoenen_US
dc.publisherCircuits and Systems journal, (http://www.SciRP.org/journal/cs)en_US
dc.subjectTester Boarden_US
dc.subjectElectronic Componentsen_US
dc.subjectElectronic Diagnostic Systemsen_US
dc.titleDesign and Implementation of an Analogue Tester Boarden_US
dc.typeArticleen_US
Appears in Collections:الهندسة الكهربائية

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