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Full metadata record
DC Field | Value | Language |
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dc.contributor.author | M. Najim, Jassim | - |
dc.date.accessioned | 2022-10-24T13:10:45Z | - |
dc.date.available | 2022-10-24T13:10:45Z | - |
dc.date.issued | 2009-01-02 | - |
dc.identifier.uri | http://localhost:8080/xmlui/handle/123456789/6051 | - |
dc.description.abstract | The silicon diode types 1N1405 subjected to different types of radiation like (x-ray and γ-radiation), it is measured by the forward and reverse bias voltage before and after irradiation, so this research study the different effect of two types of radiation on electrical properties of the diode . | en_US |
dc.publisher | Int.J.Nanoelectronics and Materials | en_US |
dc.subject | Gamma ray , Bias voltage , silicon | en_US |
dc.title | Studying the Different Effects of Gamma and x-ray Irradiation on Electrical Properties of silicon diode type 1N1405. | en_US |
Appears in Collections: | قسم الفيزياء |
Files in This Item:
File | Description | Size | Format | |
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Studying the different effects of gamma - Jassim Najim.pdf | 243.6 kB | Adobe PDF | View/Open |
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